ZHANG, M.; CHEN, J.; WANG, G.; WANG, M.; SUN, K. Metric-based Few-shot Classification in Remote Sensing Image. Artificial Intelligence Advances, [S. l.], v. 4, n. 1, p. 1–8, 2022. DOI: 10.30564/aia.v4i1.4124. Disponível em: https://journals.bilpubgroup.com/index.php/aia/article/view/4124. Acesso em: 21 nov. 2024.