TY - JOUR AU - Idris, M. M. AU - Olarinoye, I. O. AU - Kolo, M. T. AU - Ibrahim, S. O. AU - Audu, J. K. PY - 2023/02/16 Y2 - 2024/03/29 TI - High Energy X-Ray Dosimetry Using (ZnO)0.2(TeO2)0.8 Thin Filmbased Real-time X-Ray Sensor JF - Non-Metallic Material Science JA - non-met. mater. sci. VL - 5 IS - 1 SE - Article DO - 10.30564/nmms.v5i1.5369 UR - https://journals.bilpubgroup.com/index.php/nmms/article/view/5369 SP - 4-13 AB - <p>This study reports the dosimetric response of a (ZnO)0.2(TeO2)0.8 thin film sensor irradiated with high-energy X-ray radiation at various doses. The spray pyrolysis method was used for the film deposition on soda-lime glass substrate using zinc acetate dehydrate and tellurium dioxide powder as the starting precursors. The structural and morphological properties of the film were determined. The I-V characteristics measurements were performed during irradiation with a 6 MV X-ray beam from a Linac. The results revealed that the XRD pattern of the AS-deposited thin film is non-crystalline (amorphous) in nature. The FESEM image shows the non-uniform shape of nanoparticles agglomerated separately, and the EDX spectrum shows the presence of Te, Zn, and O in the film. The I-V characteristics measurements indicate that the current density increases linearly with X-ray doses (0-250 cGy) for all applied voltages (1-6 V). The sensitivity of the thin film sensor has been found to be in the range of 0.37-0.94 mA/cm2 /Gy. The current-voltage measurement test for fading normalised in percentage to day 0 was found in the order of day 0 &gt; day 15 &gt; day 30 &gt; day 1 &gt; day 2. These results are expected to be beneficial for fabricating cheap and practical X-ray sensors.</p> ER -