Vasudevan, K., Reddy, A.P.K., Pathak, G.K. and Singh, S. 2020. On the Probability of Erasure for MIMO-OFDM. Semiconductor Science and Information Devices. 2, 1 (Apr. 2020), 1–5. DOI:https://doi.org/10.30564/ssid.v2i1.1689.