M., B.N., R., G.L., S., K.M. and S., V.V. 2023. Analysis of the Effect of Radiation Defects by Low-energy Protons on Electrophysical Properties of Silicon N+ -P-P+Structure. Semiconductor Science and Information Devices. 5, 1 (Apr. 2023), 18–25. DOI:https://doi.org/10.30564/ssid.v5i1.6014.