M., B. N., R., G. L., S., K. M., & S., V. V. (2023). Analysis of the Effect of Radiation Defects by Low-energy Protons on Electrophysical Properties of Silicon N+ -P-P+Structure. Semiconductor Science and Information Devices, 5(1), 18–25. https://doi.org/10.30564/ssid.v5i1.6014