VASUDEVAN, K.; REDDY, A. P. K.; PATHAK, G. K.; SINGH, S. On the Probability of Erasure for MIMO-OFDM. Semiconductor Science and Information Devices, [S. l.], v. 2, n. 1, p. 1–5, 2020. DOI: 10.30564/ssid.v2i1.1689. Disponível em: https://journals.bilpubgroup.com/index.php/ssid/article/view/1689. Acesso em: 23 nov. 2024.