M., Bogatov N., Grigoryan L. R., Kovalenko M. S., and Volodin V. S. 2023. “Analysis of the Effect of Radiation Defects by Low-Energy Protons on Electrophysical Properties of Silicon N+ -P-P+Structure”. Semiconductor Science and Information Devices 5 (1):18-25. https://doi.org/10.30564/ssid.v5i1.6014.