Zheng, Zhen, Yuhao Shi, Xinyu Liang, and Chunqing Wang. 2019. “The Anneal Temperature Effect on the BTO and NZFO Flims and Their Capacitance - Inductance Integrated Device”. Semiconductor Science and Information Devices 1 (1):2-6. https://doi.org/10.30564/ssid.v1i1.606.