M., Bogatov N., Grigoryan L. R., Kovalenko M. S., and Volodin V. S. “Analysis of the Effect of Radiation Defects by Low-Energy Protons on Electrophysical Properties of Silicon N+ -P-P+Structure”. Semiconductor Science and Information Devices 5, no. 1 (November 10, 2023): 18–25. Accessed May 17, 2024. https://journals.bilpubgroup.com/index.php/ssid/article/view/6014.