Kumar A, Lee W-H. A Novel Process for SiGe Core-Shell JAM Transistors Fabrication and Thermal Annealing Effect on Its Electrical Performance. semicond. sci. and inf. n.a. [Internet]. 2020 Apr. 16 [cited 2024 May 3];1(2):11-8. Available from: https://journals.bilpubgroup.com/index.php/ssid/article/view/1399