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High Energy X-Ray Dosimetry Using (ZnO)0.2(TeO2)0.8 Thin Film- Based Real-Time X-Ray Sensor

In this study, we reported the dosimetric response of fabricated (ZnO)0.2(TeO2)0.8 thin film sensor during irradiation with high-energy X-ray radiation at various doses. We adopted the spray pyrolysis method for the film deposition and soda-lime glass substrate as the substrate material. We characterised the film sample for structural and morphological properties. The results revealed that the XRD pattern of the fabricated thin film is amorphous nature and FESEM image shows non-uniform shape of nanoparticles agglomerated separately. The I-V characteristics measurements indicates that the current density increases linearly with X-ray doses for all applied voltages. The current-voltage measurement test for fading normalised in percentage to day 0 was found in the order of day 0 > day 15 > day 30 > day 1 > day 2. These results are expected to be beneficial for fabricating cheap and practical X-ray sensors.